The influence of surface roughness on electrical conductance of thin Cu films: An ab initio study
Timoshevskii, V., Ke, Youqi, Guo, Hong, Gall, D.Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2937188
File:
PDF, 754 KB
english, 2008