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Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range
Barkusky, Frank, Peth, Christian, Bayer, Armin, Mann, Klaus, John, Joachim, Malinowski, Pawel E.Volume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3212666
File:
PDF, 578 KB
english, 2009