Characterization of porous tin oxide thin films and their...

Characterization of porous tin oxide thin films and their application to microsensor fabrication

Wan-Young Chung, Tae-Hoon Kim, Young-Ho Hong, Duk-Dong Lee
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Volume:
25
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0925-4005(95)85103-8
File:
PDF, 970 KB
english, 1995
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