14 MeV neutron-induced SEU in SRAM devices
Flament, O., Baggio, J., D'hose, C., Gasiot, G., Leray, J.L.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.835073
Date:
October, 2004
File:
PDF, 144 KB
english, 2004