Kinetic aspects of growth front surface morphology and...

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures 1989 / 3 Vol. 7; Iss. 2

Kinetic aspects of growth front surface morphology and defect formation during molecular-beam epitaxy growth of strained thin films

Ghaisas, S. V.
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Volume:
7
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.584730
Date:
March, 1989
File:
PDF, 746 KB
english, 1989
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