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Surface and thickness measurement of a transparent film using wavelength scanning interferometry
Gao, Feng, Muhamedsalih, Hussam, Jiang, XiangqianVolume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.021450
Date:
September, 2012
File:
PDF, 1.63 MB
english, 2012