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Note: Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance
Iverson, Brian D., Blendell, John E., Garimella, Suresh V.Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3361157
File:
PDF, 602 KB
english, 2010