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X-ray multiple diffraction of ZnO substrates and heteroepitaxial thin films
Grundmann, Marius, Scheibe, Michael, Lorenz, Michael, Bläsing, Jürgen, Krost, AloisVolume:
251
Language:
english
Journal:
physica status solidi (b)
DOI:
10.1002/pssb.201350297
Date:
April, 2014
File:
PDF, 1.84 MB
english, 2014