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Factors influencing the capacitance–voltage characteristics measured by the scanning capacitance microscope
Buh, G. H., Kopanski, J. J., Marchiando, J. F., Birdwell, A. G., Kuk, Y.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1592295
File:
PDF, 443 KB
english, 2003