[IEEE 2009 IEEE International Symposium on Industrial...

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[IEEE 2009 IEEE International Symposium on Industrial Electronics (ISIE 2009) - Seoul, South Korea (2009.07.5-2009.07.8)] 2009 IEEE International Symposium on Industrial Electronics - Statistical method-based evolvable character recognition system

Wang, Jin, Tang, Bin-bin, Piao, Chang-hao, Lei, Gai-hui
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Year:
2009
Language:
english
DOI:
10.1109/isie.2009.5213594
File:
PDF, 884 KB
english, 2009
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