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Emissivity-corrected power loss calibration for lock-in thermography measurements on silicon solar cells
Kasemann, Martin, Walter, Benjamin, Meinhardt, Christoph, Ebser, Jan, Kwapil, Wolfram, Warta, WilhelmVolume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2930880
File:
PDF, 869 KB
english, 2008