[IEEE 2010 2nd International Conference on Reliability,...

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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - A Web based workplace layout and material information system for safety management

Sarode, Dinesh M., Sharma, Rohitashva, Mundada, R. S., Apte, A.G., Bhatt, P. D., Mathew, Dominic, Kishan, Ram
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Year:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779606
File:
PDF, 1.23 MB
english, 2010
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