A new method to analyze multiexponential transients for...

Journal of Applied Physics 1990 Vol. 67; Iss. 9

A new method to analyze multiexponential transients for deep-level transient spectroscopy

Hanak, Thomas R., Ahrenkiel, Richard K., Dunlavy, Donald J., Bakry, Assem M., Timmons, Michael L.
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Volume:
67
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.344973
File:
PDF, 967 KB
english, 1990
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