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[JEDEC Solid State Technol. Assoc 2000 GaAs Reliabiltiy Workshop. Proceedings - Seattle, WA, USA (5 Nov. 2000)] 2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513) - Life testing and failure analysis of PHEMT MMICs
Anderson, W.T., Roussos, J.A., Mittereder, J.A.Year:
2000
Language:
english
DOI:
10.1109/gaasrw.2000.902418
File:
PDF, 682 KB
english, 2000