Investigating atomic contrast in atomic force microscopy...

Physical Review B 2014 / 10 Vol. 90; Iss. 15

Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips

Gross, Leo, Schuler, Bruno, Mohn, Fabian, Moll, Nikolaj, Pavliček, Niko, Steurer, Wolfram, Scivetti, Ivan, Kotsis, Konstantinos, Persson, Mats, Meyer, Gerhard
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Volume:
90
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.90.155455
Date:
October, 2014
File:
PDF, 2.69 MB
english, 2014
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