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Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy
Pratt, Jon R., Shaw, Gordon A., Kumanchik, Lee, Burnham, Nancy A.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3284957
File:
PDF, 523 KB
english, 2010