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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Observation of Single Electron Tunneling and Ballistic Transport in Twin Silicon Nanowire MOSFETs (TSNWFETs) Fabricated by Top-Down CMOS Process
Cho, Keun Hwi, Suk, Sung Dae, Yeoh, Yun Young, Li, Ming, Yeo, Kyoung Hwan, Kim, Dong-Won, Hwang, Sung Woo, Park, Donggun, Ryu, Byung-IlYear:
2006
Language:
english
DOI:
10.1109/iedm.2006.346839
File:
PDF, 1.66 MB
english, 2006