[IEEE 2006 International Electron Devices Meeting - San...

  • Main
  • [IEEE 2006 International Electron...

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Observation of Single Electron Tunneling and Ballistic Transport in Twin Silicon Nanowire MOSFETs (TSNWFETs) Fabricated by Top-Down CMOS Process

Cho, Keun Hwi, Suk, Sung Dae, Yeoh, Yun Young, Li, Ming, Yeo, Kyoung Hwan, Kim, Dong-Won, Hwang, Sung Woo, Park, Donggun, Ryu, Byung-Il
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/iedm.2006.346839
File:
PDF, 1.66 MB
english, 2006
Conversion to is in progress
Conversion to is failed