Structural evaluation of epitaxially grown organic...

Journal of Applied Physics 1993 Vol. 73; Iss. 11

Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer

Ishida, Kenji, Hayashi, Kouichi, Yoshida, Yuji, Horiuchi, Toshihisa, Matsushige, Kazumi
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Volume:
73
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.354024
File:
PDF, 901 KB
english, 1993
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