Junction leakage studies in rapid thermal annealed diodes

Applied Physics Letters 1984 Vol. 45; Iss. 7

Junction leakage studies in rapid thermal annealed diodes

Kamgar, Avid, Fichtner, W., Sheng, T. T., Jacobson, D. C.
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Volume:
45
Year:
1984
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.95387
File:
PDF, 520 KB
english, 1984
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