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Universal interface width distributions at the depinning threshold
Rosso, Alberto, Krauth, Werner, Doussal, Pierre Le, Vannimenus, Jean, Wiese, Kay JörgVolume:
68
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.68.036128
Date:
September, 2003
File:
PDF, 63 KB
english, 2003