In situ scanning microprobe reflection high-energy electron...

In situ scanning microprobe reflection high-energy electron diffraction observation of GaAs surfaces during molecular-beam epitaxial growth

Isu, Toshiro
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Volume:
7
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.584631
Date:
July, 1989
File:
PDF, 693 KB
english, 1989
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