Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
1989 / 7 Vol. 7; Iss. 4
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In situ scanning microprobe reflection high-energy electron diffraction observation of GaAs surfaces during molecular-beam epitaxial growth
Isu, ToshiroVolume:
7
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.584631
Date:
July, 1989
File:
PDF, 693 KB
english, 1989