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[IEEE International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Honolulu, HI, USA (5-6 June 1994)] Proceedings of International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Two-dimensional energy-dependent substrate current models for deep submicron MOSFETs
Yeap, C.-F., Hasnat, K., Agostinelli, V.M., Bordelon, T.J., Jallepalli, S., Wang, X.L., Maziar, C.M., Tasch, A.F.Year:
1994
Language:
english
DOI:
10.1109/nupad.1994.343501
File:
PDF, 278 KB
english, 1994