Ab initio calculations and ellipsometry...

Physical Review B 2010 / 2 Vol. 81; Iss. 7

Ab initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor

Makinistian, L., Albanesi, E. A., Gonzalez Lemus, N. V., Petukhov, A. G., Schmidt, D., Schubert, E., Schubert, M., Losovyj, Ya. B., Galiy, P., Dowben, P.
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Volume:
81
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.81.075217
Date:
February, 2010
File:
PDF, 778 KB
english, 2010
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