thin films: Phase transition and critical thickness study
Venkatesan, Sriram, Vlooswijk, Ard, Kooi, Bart J., Morelli, Alessio, Palasantzas, George, De Hosson, Jeff T. M., Noheda, BeatrizVolume:
78
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.78.104112
Date:
September, 2008
File:
PDF, 695 KB
english, 2008