[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Bias temperature instability variation on SiON/Poly, HK/MG and trigate architectures
Prasad, C., Agostinelli, M., Hicks, J., Ramey, S., Auth, C., Mistry, K., Natarajan, S., Packan, P., Post, I., Bodapati, S., Giles, M., Gupta, S., Mudanai, S., Kuhn, K.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861101
File:
PDF, 909 KB
english, 2014