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[IEEE 2011 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC 2011) - Orlando, FL, USA (2011.12.12-2011.12.15)] IEEE Conference on Decision and Control and European Control Conference - Sensor fault diagnosis for bilinear systems using data-based residuals
Hakem, Assia, Pekpe, Komi Midzodzi, Cocquempot, VincentYear:
2011
Language:
english
DOI:
10.1109/CDC.2011.6161208
File:
PDF, 424 KB
english, 2011