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Characterization of the defect density and band tail of an a-Si:H i-layer for solar cells by improved CPM measurements
Manabu Sasaki, Shingo Okamoto, Yoshihiro Hishikawa, Shinya Tsuda, Shoichi NakanoVolume:
34
Year:
1994
Language:
english
Pages:
7
DOI:
10.1016/0927-0248(94)90083-3
File:
PDF, 294 KB
english, 1994