Characterization of the defect density and band tail of an...

Characterization of the defect density and band tail of an a-Si:H i-layer for solar cells by improved CPM measurements

Manabu Sasaki, Shingo Okamoto, Yoshihiro Hishikawa, Shinya Tsuda, Shoichi Nakano
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
34
Year:
1994
Language:
english
Pages:
7
DOI:
10.1016/0927-0248(94)90083-3
File:
PDF, 294 KB
english, 1994
Conversion to is in progress
Conversion to is failed