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Frustration-driven micromagnetic structure in Fe/CoO/Fe thin film layered systems
Brambilla, A., Sessi, P., Cantoni, M., Finazzi, M., Rougemaille, N., Belkhou, R., Vavassori, P., Duò, L., Ciccacci, F.Volume:
79
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.79.172401
Date:
May, 2009
File:
PDF, 227 KB
english, 2009