[IEEE IC's (ISPSD) - Barcelona, Spain (2009.06.14-2009.06.18)] 2009 21st International Symposium on Power Semiconductor Devices & IC's - Non-destructive current measurement for surface mounted power MOSFET on VRM board using magnetic field probing technique
Yoshiko Ikeda,, Yoshihiro Yamaguchi,, Kawaguchi, Yusuke, Masakazu Yamaguchi,, Ichiro Omura,, Tomokazu Domon,Year:
2009
Language:
english
DOI:
10.1109/ispsd.2009.5158002
File:
PDF, 485 KB
english, 2009