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[IEEE IC's (ISPSD) - Barcelona, Spain (2009.06.14-2009.06.18)] 2009 21st International Symposium on Power Semiconductor Devices & IC's - Non-destructive current measurement for surface mounted power MOSFET on VRM board using magnetic field probing technique

Yoshiko Ikeda,, Yoshihiro Yamaguchi,, Kawaguchi, Yusuke, Masakazu Yamaguchi,, Ichiro Omura,, Tomokazu Domon,
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Year:
2009
Language:
english
DOI:
10.1109/ispsd.2009.5158002
File:
PDF, 485 KB
english, 2009
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