Spectroscopic analysis of Al and N diffusion in HfO2
Lysaght, P. S., Woicik, J. C., Sahiner, M. A., Price, J., Weiland, C., Kirsch, P. D.Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4754578
File:
PDF, 1.91 MB
english, 2012