Model for the dry etching of heavily doped n-type silicon by atomic fluorine in the absence of ion bombardment
Kojima, Masahiko, Kato, Hisao, Gatto, MitsuruVolume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356623
File:
PDF, 1.03 MB
english, 1994