Admittance measurements of metal–insulator–semiconductor devices in p-type HgCdTe
Nemirovsky, Y.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575491
Date:
July, 1988
File:
PDF, 770 KB
english, 1988