[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - A new failure mechanism on analog I/O cell under ND-mode esd stress in deep-submicron CMOS technology
Shih-Hung Chen,, Ming-Dou Ker,, Che-Hao Chuang,Year:
2005
Language:
english
DOI:
10.1109/ipfa.2005.1469163
File:
PDF, 1.74 MB
english, 2005