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Abnormal electrical behavior and phase changes in implanted p[sup +]- and n[sup +]-Si channels under high current densities
Huang, J. S., Liao, C. N., Tu, K. N., Cheng, S. L., Chen, L. J.Volume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368802
File:
PDF, 696 KB
english, 1998