Controlling FIB-SBEM slice thickness by monitoring the...

Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beam

BOERGENS, K. M., DENK, W.
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Volume:
252
Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12086
Date:
December, 2013
File:
PDF, 497 KB
english, 2013
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