Characterization of the CeO 2...

Integrated Ferroelectrics 2001 / 01 Vol. 40; Iss. 1-5

Characterization of the CeO 2 thin films for insulation layer and Pt/SrBi 2 Ta 2 O 9 /CeO 2 /Si MFISFET structure

Park, Sang-Shik, Yoon, Soon-Gil
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Volume:
40
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108010842
Date:
January, 2001
File:
PDF, 442 KB
english, 2001
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