XPS film thickness and adsorption studies of...

Colloids and Surfaces A: Physicochemical and Engineering Aspects 1995 Vol. 102; Iss. none

XPS film thickness and adsorption studies of alkyltrimethylammonium bromides and organosilanes on silica surfaces

Thomas J. Horr, Pawittar S. Arora, John Ralston, Roger St.C. Smart
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Volume:
102
Year:
1995
Language:
english
Pages:
10
DOI:
10.1016/0927-7757(95)03276-j
File:
PDF, 744 KB
english, 1995
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