![](/img/cover-not-exists.png)
[IEEE 2010 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Seattle, WA, USA (2010.08.1-2010.08.4)] 2010 53rd IEEE International Midwest Symposium on Circuits and Systems - Silicon sensor with high sensibility from 200 to 1100 nm using embedded silicon nano-particles
Aceves-Mijares, M., Diaz-Mendez, A., Pedraza, J., Miguel Rocha-Perez, J., Gallardo, A., Gomez, E., Dominguez, C.Year:
2010
Language:
english
DOI:
10.1109/mwscas.2010.5548787
File:
PDF, 878 KB
english, 2010