[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Converting total-radiated-power measurements to equivalent E-Field Data
Garbe, Heyno, Battermann, SvenYear:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652048
File:
PDF, 530 KB
english, 2008