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Transient-current measurement of the trap charge density at interfaces of a thin-film metal∕ferroelectric∕metal structure
L. A. Delimova, I. V. Grekhov, D. V. Mashovets, S. E. Tyaginov, S. Shin, J. Koo, S. Kim, Y. ParkYear:
2005
Language:
english
DOI:
10.1063/1.2125122
File:
PDF, 398 KB
english, 2005