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DX centers in Al[sub 0.3]Ga[sub 0.7]As/GaAs analyzed by point contact measurements
M. Hauke, J. Jakumeit, B. Krafft, G. Nimtz, A. Förster, H. LüthYear:
1998
Language:
english
DOI:
10.1063/1.368261
File:
PDF, 382 KB
english, 1998