![](/img/cover-not-exists.png)
Numerical analysis of x-ray reflectivity data from organic thin films at interfaces
Asmussen, Axel, Riegler, HansVolume:
104
Year:
1996
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.471492
File:
PDF, 348 KB
english, 1996