Numerical analysis of x-ray reflectivity data from organic...

Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

Asmussen, Axel, Riegler, Hans
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Volume:
104
Year:
1996
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.471492
File:
PDF, 348 KB
english, 1996
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