![](/img/cover-not-exists.png)
Cover Picture: Intensity-voltage low-energy electron microscopy for functional materials characterization (Phys. Status Solidi RRL 6/2014)
Flege, Jan Ingo, Krasovskii, Eugene E.Volume:
8
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201470532
Date:
June, 2014
File:
PDF, 329 KB
2014