X-ray reflectivity study of interface roughness, structure, and morphology of alignment layers and thin liquid crystal films
Cull, Brian, Shi, Yushan, Kumar, Satyendra, Shih, Raymond, Mann, J.Volume:
51
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.51.526
Date:
January, 1995
File:
PDF, 1.79 MB
1995