X-ray reflectivity study of interface roughness, structure,...

X-ray reflectivity study of interface roughness, structure, and morphology of alignment layers and thin liquid crystal films

Cull, Brian, Shi, Yushan, Kumar, Satyendra, Shih, Raymond, Mann, J.
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Volume:
51
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.51.526
Date:
January, 1995
File:
PDF, 1.79 MB
1995
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