[IEEE 3rd International Conference 'Novel Applications of Wide Bandgap Layers' - Zakopane, Poland (26-30 June 2001)] 3rd International Conference 'Novel Applications of Wide Bandgap Layers' Abstract Book (Cat. No.01EX500) - X-ray diffraction study on ELOG (epitaxial lateral overgrowth) GaN layers
Domagala, J., Beaumont, B.Year:
2001
Language:
english
DOI:
10.1109/wbl.2001.946559
File:
PDF, 105 KB
english, 2001