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[IEEE 2010 IEEE Fourth International Conference On Biometrics: Theory, Applications And Systems (BTAS) - Washington, DC, USA (2010.09.27-2010.09.29)] 2010 Fourth IEEE International Conference on Biometrics: Theory, Applications and Systems (BTAS) - Face system evaluation toolkit: Recognition is harder than it seems

Iyer, Vijay N., Scheirer, Walter J., Boult, Terrance E.
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Year:
2010
Language:
english
DOI:
10.1109/btas.2010.5634517
File:
PDF, 2.64 MB
english, 2010
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