[IEEE 2012 IIAI International Conference on Advanced Applied Informatics (IIAIAAI) - Fukuoka, Japan (2012.09.20-2012.09.22)] 2012 IIAI International Conference on Advanced Applied Informatics - Automatic Information Extraction of Experiments from Nanodevices Development Papers
Dieb, Thaer M., Yoshioka, Masaharu, Hara, ShinjiroYear:
2012
Language:
english
DOI:
10.1109/iiai-aai.2012.18
File:
PDF, 170 KB
english, 2012