![](/img/cover-not-exists.png)
[IEEE 2006 Asia-Pacific Microwave Conference - Yokohama, Japan (2006.12.12-2006.12.15)] 2006 Asia-Pacific Microwave Conference - Removing S-parameters on-wafer measurements parasitic elements using time domain gating: Application to transmission lines
Abessolo-Bidzo, Dolphin, Poirier, Patrick, Descamps, Philippe, Hubert, OlivierYear:
2006
Language:
english
DOI:
10.1109/apmc.2006.4429491
File:
PDF, 280 KB
english, 2006