[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - High-Q inductors in standard silicon interconnect technology and its application to an integrated RF power amplifier
Burghartz, J.N., Soyuer, M., Jenkins, K.A., Hulvey, M.D.Year:
1995
Language:
english
DOI:
10.1109/iedm.1995.499389
File:
PDF, 408 KB
english, 1995