Ultimate limits to quantum metrology and the meaning of the Heisenberg limit
Zwierz, Marcin, Pérez-Delgado, Carlos A., Kok, PieterVolume:
85
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.85.042112
Date:
April, 2012
File:
PDF, 366 KB
english, 2012